In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reflectivity and angle-dependent x-ray fluorescence measurements are combined, resulting in a structural and chemical analysis of the samples.
No takes yet. Share an insight, caveat, or question.
Leenaers et al. (1997) studied this question.