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October 16, 2019IEEE Journal of Solid-State Circuits

A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm

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Authors

ZLZhen-Yu LiangHWHao-Hsuan WeiTLTsung-Te LiuNational Taiwan University

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Cite This Study

Liang et al. (2019) studied this question.

synapsesocial.com/papers/6ab1ef544515ffbb2befc8a0https://doi.org/10.1109/jssc.2019.2942374
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