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Field emission properties of diamond films were studied by macroscopic I–V measurement. A lower turn-on field and a higher emission current were observed for diamond films produced by higher methane concentration, or with higher density of defects, introduced by ion implantation. However, diamond films of poorer quality experience a severe reliability problem. Cold implantation followed by rapid thermal or laser annealing produced diamond emitters with a turn-on field as low as 5 V/μm and the desired reliability.
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Fox et al. (1997) studied this question.
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