Thermal field emission (T.F.E.) from 〈310〉LaB6 single-crystal was, first, successfully used as an electron source of high brightness in a commercial-type transmission electron microscope (TEM). A preliminary experiment for measuring the brightness was performed with TEM, JEM-100CX-FEG, leading to coarse assessment that the brightness of the T.F.E. of (310) spot is two orders of magnitude higher than that of the conventional thermionic emission from LaB6, single-crystal.
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Harada et al. (1991) studied this question.