Crack tips in thin SiO 2 glass films were observed directly by high‐resolution/high‐voltage electron microscopy. An elliptical crack with radius of curvature ∼ 1.5 nm was observed. When the glass film with the crack was soaked in water at 90°C for 7 d, the crack tip became blunt by a process of dissolution and precipitation.
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Bando et al. (1984) studied this question.
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