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A microscale ion trap mass spectrometer (r0=0.50 mm, z0=0.55 mm) with an electron gun for electron impact ionization of gaseous samples is described. Operated in the mass-instability mode, the trap had a m/z range from 40 to 400 Da. For single scans, peak widths of less than 0.2 Da were obtained.
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Kornienko et al. (1999) studied this question.
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