We have fabricated carbon nanotube (CNT) field-effect transistors (FETs) by direct growth of single-wall CNTs between the source and drain electrodes, and investigated their device characteristics. The FETs show ambipolar operation. The temperature and bias voltage dependence of device characteristics are consistent with device operation of the Schottky-type FET. The carrier injection barrier heights for both the electron and hole carriers show small values of 17–74meV, without any additional specific treatment after device fabrication.
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Inami et al. (2008) studied this question.
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