High resolution switching magnetization magnetic force microscopy

We introduce switching magnetization magnetic force microscopy based on two-pass scanning atomic force microscopy with reversed tip magnetization between the scans. Within this approach the sum of the scanned data with reversed tip magnetization depicts local van der Waals forces, while their differences map the local magnetic forces. Here we implement this method by fabricating low-momentum magnetic probes that exhibit magnetic single domain state, which can be easily reversed in low external field during the scanning. Measurements on high-density parallel and perpendicular magnetic recording media show enhanced spatial resolution of magnetization.