Temperature-dependent relaxation dynamics in sintered sodium silicate: A CIS approach

The dielectric relaxation behaviour of sodium silicate (Na 2 SiO[Formula: see text] was examined using complex impedance spectroscopy (CIS) over a broad frequency range (100–5[Formula: see text]MHz) and at varying temperatures (50–450 ∘ C). The orthorhombic crystal phase was synthesized through sintering. CIS analysis indicated high complex impedance in the low-frequency range, signifying significant dispersion linked to the ion or cation relaxation mechanisms within the crystal lattice. A decrease in energy loss ([Formula: see text] with increasing frequency was observed at all temperatures, aligning with typical behaviour for sodium silicate. The relaxation times were calculated using dielectric functions [Formula: see text] and [Formula: see text]. The temperature-dependent relaxation plot followed Arrheniu’s law, where the slope corresponds to the activation energy. This analysis provides insights into the frequency-dependent dielectric properties and the relaxation processes in sodium silicate, highlighting the influence of temperature on ionic movement within the crystal structure.