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Hydrogen and hydrogen-containing gases are commonly used as reductants in chemical vapor deposition growth of MoS 2 . Here, we consider the defects resulting from the presence of hydrogen during growth and the resulting electronically active defects. In particular, we find that the interstitial hydrogen defect is a negative- U center with amphoteric donor and acceptor properties. Additionally, we consider the effects of interaction with water and oxygen. The defects are analysed using density functional theory calculations.
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Ferreira et al. (2017) studied this question.
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