A new optical system for measuring the slope, thickness and wave velocity of a liquid film flow is presented. The theory of the system is discussed and the equations derived are employed in simulations involving film flow with low- and high-amplitude waves. The results, which show that it is possible to determine the three parameters for a low-amplitude wave, while only the wave velocity may be found for a high-amplitude wave, may have potential applications in multi-phase flow systems.
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Than et al. (1993) studied this question.
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