Answers are grounded in this paper and cite their sources.
A method of using X-ray absorption spectroscopy together with resolved grazing-incidence geometry for depth profiling of atomic, electronic or chemical local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.
No takes yet. Share an insight, caveat, or question.
Souza-Neto et al. (2009) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: