Study of electrical properties of silica glasses, intended for FED spacers, under electron irradiation

The charge properties, under electron irradiation, of three types of glasses are studied by employing scanning electron microscope (SEM) associated with the technique called the electrostatic influence method. The experimental conditions are closed to those of typical field emission display (FED) operation. To determine the amount of trapped charges during and after electron irradiation, a special arrangement adapted to the SEM was used. This arrangement allows displacement and leakage currents to be simultaneously measured. The secondary electron emission yield during electron irradiation is also deduced. The trapping ability of each glass is analyzed taking into account the regulation mechanisms involved under electron irradiation. Finally useful indications permitting an adequate selection of glasses that may be used as FED spacers are deduced.