An extended cavity resonance method using the TE10n mode is discussed for measuring complex permittivity of dielectric films and foils of flexible dimensions nondestructively. Working relations for dielectric parameters ε′ and ε″ are obtained on extending the validity of conventional cavity perturbation technique. Results of measurements performed on mylar are presented. The method is suitable for the determination of complex permittivity of dielectric thin films.
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Thomas et al. (1997) studied this question.
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