By using the total reflecting properties of x‐rays inside glass capillary tubes, intense fine or microbeams of x‐rays can be obtained. In combination with conventional diffraction x‐ray tubes, microbeams with a diameter of a few micrometres and with an intensity sufficient for trace element analysis can be achieved. The basic physics behind the capillary technique is reviewed and an energy‐dispersive x‐ray fluorescence microbeam spectrometer for trace element analysis is described. Examples of applications of the microbeam spectrometer are given and the future perspectives of the capillary technique are discussed.
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Rindby et al. (1989) studied this question.
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