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May 28, 2004Journal of Applied PhysicsOpen Access

Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator

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Authors

EBEric BlackSartorius (United Kingdom)IGIvan S. GrudininKorea Institute of Radiological and Medical SciencesSRShanti RaoMassachusetts Institute of Technology

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Black et al. (2004) studied this question.

synapsesocial.com/papers/6ab7159c0a2a2fa37dfb8db7https://doi.org/10.1063/1.1728312
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