MÖNCH is a 25 μm pitch hybrid silicon pixel detector with a charge integrating analog read-out front-end in each pixel. The small pixel size brings new challenges in bump-bonding, power consumption and chip design. The MÖNCH02 prototype ASIC, manufactured in UMC 110 nm technology with a field of view of 4 × 4 mm 2 and 160 × 160 pixels, has been characterized in the single photon regime, i.e. with less than one photon acquired per frame on average on a 3 × 3 pixel cluster. The low noise and small pixel size allow spatial interpolation with high resolution. Understanding charge sharing as a function of the photon absorption depth and sensor bias is a key for optimal processing of single photon data for high resolution imaging. To characterize the charge collection of the detector, the sensor was illuminated with a 20 k e V photon beam in edge-on configuration at the SYRMEP beamline of Elettra. By slicing the beam by means of a 5 μm slit and scanning through the 320 μm silicon sensor depth, the charge collection is characterized as a function of the photon absorption depth for different sensor bias voltages.
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Cartier et al. (2015) studied this question.
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