This letter analyzes the common-inductive-biased dual-shunt switch circuits for millimeter-wave applications. With the introduced biasing inductor at control pins, the dual-shunt switches reveal >50% reduction in its equivalentoff-capacitance at a proper inductor sizing, subsequently leading to improved switching ratio of isolation over insertion loss for a shunt switching cell. To validate the design theory, aW-band single-pole-double-throw switch was designed and fabricated in a 0.13-μm SiGe technology. The measured results show an operation bandwidth of 80–110 GHz, an in-band insertion loss of 1.8–3 dB, and an enhanced isolation of 32–47 dB. It demonstrates the highest ratio of isolation over insertion loss among similar silicon-basedW-band switches.
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Miao et al. (2025) studied this question.
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