Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets.
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Kunz et al. (2012) studied this question.
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