Photoinduced current transient spectroscopy (PICTS) has been utilized to study electrically active defects in TlInS 2 single crystals doped with Er, B, and Tb. Eight traps with activation energies lying in between 0.21 to 0.55 eV have been detected. The origin of these traps is discussed.
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Seyidov et al. (2011) studied this question.