An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments' LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis.
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Jonker et al. (1999) studied this question.
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