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July 4, 1985Electronics LettersOpen Access

Degradation mechanisms induced by temperature in power MESFETs

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Authors

CCC. CanaliBerlin University of the ArtsFFF. FantiniON Semiconductor (United States)LUL. Umena

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Canali et al. (1985) studied this question.

synapsesocial.com/papers/6ab9df1d013637f052d528b3https://doi.org/10.1049/el:19850423
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