The dc drift of LiNbO(3) (LN) optical intensity modulators is experimentally investigated from the viewpoint of the repeatability of the phenomenon. The drift has been assumed to be reversible and be independent of the magnitude of the applied dc bias. However, a bias voltage dependency of the dc drift is experimentally manifested here, especially under a high bias voltage. By an iterative dc bias application for the same LN modulator, the drift rate is increased, and a hysterisis appears in the drift/recovery cycles.
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Mitsugi et al. (1996) studied this question.
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