We present a procedure associated with nonlinear wavelet methods that provides adaptive confidence intervals around f (x₀), in either a white noise model or a regression setting. A suitable modification in the truncation rule for wavelets allows construction of confidence intervals that achieve optimal coverage accuracy up to a logarithmic factor. The procedure does not require knowledge of the regularity of the unknown function f; it is also efficient for functions with a low degree of regularity.
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Picard et al. (2000) studied this question.
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