CMOS device aging critically challenges digital circuit design, where conventional timing analysis struggles with the large number of input conditions, standard cells, and process corners. This work proposes ATAN, a novel framework for accelerating aging-aware timing analysis, employing a hybrid graph neural network. Synergistically combining a relational graph convolutional network and a graph attention network, the unique dual-branch framework captures complementary structural timing information and aging-sensitive variations for accurate aging-aware delay prediction. Integrated few-shot learning enables rapid adaptation to unseen standard cells and corners with minimal samples. Simulation results demonstrate that ATAN reduces prediction error by 5% to 28% compared with representative aging-aware delay prediction methods while achieving over 600× speedup for single-condition delay inference compared with SPICE simulations. The framework enables efficient few-shot adaptation to new scenarios, drastically reducing the required data and fine-tuning cost. ATAN achieves SPICE-comparable accuracy with substantially reduced computational cost, offering an efficient and scalable solution for reliability-centric design.
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Zhang et al. (2026) studied this question.
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