A polyimide-coated substrate is rubbed periodically with the stylus of an atomic-force microscope. The effective polar and azimuthal anchoring strength coefficients for planar anchoring are determined as a function of the spatial separation L of rub lines. Both anchoring coefficients are found to decrease monotonically with L, apparently leveling off at nonzero values for L≳2 μm. The observed behavior is discussed in terms of a combination of intrinsic anchoring strength in the rubbed regions and a surface memory effect.
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Wen et al. (2001) studied this question.
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