Atomic resolution imaging using electron energy-loss phonon spectroscopy

Inelastic scattering of electrons on crystals can excite lattice vibrations known as phonons. An energy resolution of 10 meV in the scattered electron energy loss has recently been demonstrated in scanning transmission electron microscopy (STEM), permitting experimenters to distinguish between elastic and inelastic scattering events. In this paper the authors present simulations showing that, with the recent improvement in energy resolution, atomic resolution phonon spectroscopy and imaging of crystals using STEM should now be feasible.