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The distribution of the local critical current and the n -value along the sample length and its relation to the overall critical current were studied experimentally and analytically for the bent multifilamentary Bi2223/Ag/Ag–Mg alloy superconducting composite tape. Then, based on the results, it was attempted to simulate on a computer the dependence of the critical current on the sample length. The main results are summarized as follows. The experimentally observed relation of the distributed local critical current and n -value to the overall critical current was described comprehensively with a simple voltage summation model, in which the sample was regarded as a one-dimensional series circuit. The sample length dependence of the critical current was reproduced on the computer by a Monte Carlo simulation incorporating the voltage summation model and the regression analysis results for the local critical current distribution and the relation of the n -value to the critical current.
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Ochiai et al. (2006) studied this question.
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