A Comparative X‐Ray and Neutron Reflectometry Study of Plasma Polymer Films Containing Reactive Amines

Glow discharge AApp and HApp were prepared on silicon wafers and analyzed by XPS, AFM, ΔV (ζ‐measurements), XRR and NR. XRR and AFM measurements revealed smooth films of ≈30 nm thickness. XPS measurements in combination with XRR and NR allowed the film composition and mass densities (1.46 and 1.05 g · cm−3 for AApp and HApp respectively) to be calculated. The AApp film in contact with water was found to swell by ≈5%, contain ≈3% water and have ≈24% labile protons. The HApp film did not appear to swell, but contained ≈5% water, with ≈10% labile protons. The difference in the degree of proton exchange within the films and zeta potentials was attributed to the higher degree of residual amine functionality in the AA film. magnified image