Preprinted for 1960 Conference on Standards and Electronic Measurements, Boulder, Colorado, June 1960. Silicon junction (zener) diodes were investigated for use as a voltage reference in a militarized test set capable of operating many months in adverse environments without d with respect to temperature coefficient, noise, and longterm stability that have sufficient stability to replace unsaturated standard cells. The average standard deviation observed for 11 selected diodes tested for four months was 3.1 ppm. (auth)
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Baker et al. (1960) studied this question.
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