A passive integrated optical waveguide refractometer based on bendloss changes in a spiral-shaped channel waveguide is proposed and fabricated in Si3N4/SiO2 technology. The experimentally determined performance and the theoretical predictions, based on a simple model for so-called “whispering gallery modes,” agree very well. The minimum detectable refractive index change was measured to be Δn=1.3×10−5.
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Veldhuis et al. (1997) studied this question.
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