Metal halide perovskite has shown great potential for X‐ray detectors due to their superior properties such as high X‐ray attenuation coefficients and large charge carrier mobility‐lifetime (μτ) product. Compared with the widely investigated polycrystalline thin films, perovskite single crystals without grain boundaries possess lower trap density and better optoelectronic properties, which results in higher sensitivity and lower detection limits for X‐ray detection. In this review, the recent progress of single‐crystal perovskite growth methods and X‐ray detector application are summarized, followed by a detailed description of the composition engineering of single‐crystal perovskites for X‐ray detection. Finally, a discussion about the challenges and perspectives in the development of perovskite single‐crystal X‐ray detectors is presented.
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Sun et al. (2026) studied this question.
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