Exchange bias effect in Fe films deposited on Si(100) substrates

The crystal structure and exchange bias effect in Fe films deposited on Si(100) substrates have been investigated. X‐ray diffraction and fluorescence‐extended X‐ray absorption fine structure measurements reveal that the as‐deoposited Fe films are polycrystalline with a preferred (110) texture. In addition, we observe a shift in the magnetic hysteresis loop of Fe films deposited on Si (100) where there is existance of a thin oxidized layer. By comparison, for Fe film deposited on Si(100) lacking the oxidized layer, it does not exhibit any features of shift in the magnetic hysteresis loop. We postulate the effect results from a coupling between the ferromagnetic Fe film and the antiferromagnetic Fe oxide that forms spontaneously in the interface. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)