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Spatial performance nonuniformities critically limit the efficiency and scalability of perovskite solar cells. Although photoluminescence and electroluminescence imaging are widely used to visualise these inhomogeneities, the information extracted is often limited, for instance, preventing discrimination between bulk and interface defects. Here, we couple photoluminescence and electroluminescence imaging with device‐physics‐based statistical modelling to identify spatial performance losses. By jointly analysing current–voltage characteristics and luminescence images under multiple excitation conditions, the approach enables, for the first time, quantitative extraction of physical defect parameters and unambiguous separation of bulk and interface defects in localised regions. We resolve the coexistence of reduced photoluminescence and enhanced electroluminescence in both n–i–p and p–i–n devices, showing that it arises from increased interface defect density combined with reduced contact resistance. This study transforms luminescence imaging into a quantitative diagnostic framework for guiding materials, interface and process development in perovskite solar cells.
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Julien et al. (2026) studied this question.
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