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Redox processes in oxides are central to materials synthesis and functionality, but their control is often hindered by surface instabilities. Using ambient-pressure X-ray photoelectron spectroscopy, we show that a nominally 1 nm-thick SrTiO3 (STO) cap markedly enhances the surface stability of La0.05Sr0.95FeO2.5-δ (LSFO) thin films during H2 reduction by suppressing the formation of a secondary metallic Fe0 phase. Kinetic analysis indicates that the STO cap reduces the effective Fe0 formation rates by more than 6-fold at both 250 and 350 °C. These findings highlight ultrathin capping layers as an effective strategy for stabilizing oxide surfaces during redox.
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Wang et al. (2026) studied this question.
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