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We observe the "minimum metallic conductivity, " ₌, to be a decreasing function of surface-state charge density, Qₒₒ, near the Si-SiO₂ interface. This dependence of ₌ on Qₒₒ is contrary to Mott's concept of minimum metallic conductivity, but explains the large differences in ₌ reported in the recent literature.
Tsui et al. (Mon,) studied this question.
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