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Views Icon Views Article contents Figures Electrical Characterization of Resistive Switching Memories. AIP Conference Proceedings 10 November 2011; 1395 (1): 139–147. https://doi.org/10.1063/1.3657880 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioAIP Conference Proceedings Search Advanced Search |Citation Search
Chen et al. (Sat,) studied this question.