High-Temperature Atomized Water-Assisted Reconstruction of CsPbBr3 Wafers for High-Performance X-Ray Detection

In this letter, CsPbBr 3 wafers are obtained through the pressure-induced aggregation of CsPbBr 3 powder and further modified through a high-temperature atomized water (HTAW) treatment strategy for the first time. Such a strategy helps to the reconstruction of CsPbBr 3 grains in the HTAW environment and thus the densification of the wafer surface. The as-fabricated wafers were used to develop X-ray detectors that exhibited a dark resistivity of 2.43 × 10 9 Ω, sensitivity of 143845.34 μC Gy air -1 cm -2 at 20 V bias, and detection limit of 121.21 nGy s -1 , which are greatly improved than those of the pristine CsPbBr 3 wafers and among the highest performance of reported CsPbBr 3 perovskite X-ray detectors. Our work provides a reliable strategy for optimizing finished perovskite wafers and enhancing the performance of X-ray detectors.