Dynamic wetting poses a well-known challenge in classical sharp-interface formulation as the no-slip wall condition leads to a contact line singularity that is typically regularized with a Navier boundary condition, often requiring empirical fitting for the slip length. On the other hand, this paradox does not appear in phase-field models as the contact line moves through diffusive mass transport. In this work, we present a toy model that accounts for mass diffusion at the contact line within a sharp-interface framework. This model is based on a theoretical relation derived from the Cahn-Hilliard equations, which links the total diffusive mass transport to the curvature at the wall. From an estimate of the chemical potential on a curved interface, we obtain an expression for the width of the highly curved region δ and the apparent angle. In the sharp-interface model, we then introduce a fictitious boundary, displaced by a distance δ into the domain, where a Navier boundary condition is applied along a dynamic apparent contact angle that accounts for the local interface bending. The robustness of the model is assessed by comparing the toy model results with standard phase-field ones on two cases: the steady state profiles of a liquid bridge between two plates moving in opposite directions and the transient behaviors of a drop spreading on a solid with a prescribed equilibrium angle. This offers a practical and efficient alternative to solve contact line problems at lower cost in a sharp-interface framework with input parameters from phase-field models.
Fullana et al. (Tue,) studied this question.