We introduce the Delta-Gate formalism, a probabilistic model defined on the logarithmic scale distance Δ = log₁₀ (X/Xcr), with transition probability P (R=1|X) = σ (wΔ − τ). In the limit w → ∞, the model recovers the classical hard-threshold rule as a special case. Empirical illustration using LDPE dielectric breakdown data (N=60, RMSE 0. 046–0. 071) shows fit quality comparable to Weibull models with superior physical interpretability.
Fabio Zander (Sun,) studied this question.