This work introduces a field-theoretical model designed to simulate the presence of material layers with magnetoelectric properties. The model comprises the standard Maxwell field coupled to a Chern-Simons field confined to a planar layer. The electromagnetic behavior of the boundary is emulated through the interaction between the Chern-Simons and Maxwell fields, governed by two parameters: the Chern-Simons mass and the coupling constant between the fields. Both parameters can be adjusted to reflect the specific properties of different materials. We compute the exact propagator of the theory and employ it to investigate several physical properties. Our analysis focuses on phenomena that arise from the presence of external sources coupled to both the Maxwell and Chern-Simons fields, considering various scenarios. In the Chern-Simons sector, the sources emulate defects in the crystal lattice of the material layer. The main objective of this paper is to present the proposed model and to explore its behavior in the simple context of a single planar material interface. We also suggest possible extensions of the model to more general configurations.
Barone et al. (Thu,) studied this question.