Thin ferroelectric films of Ba0.5Sr0.5TiO3, grown on various substrates (Sp, LaAlO3 polycor) using Rf spattering technology, were studied using spectroscopic methods (IR absorption, Raman scattering, second harmonic generation). The actual properties of these films (thickness, rate of grows temperature dependence of order parameter e.a.) were obtained.
Pugachev et al. (Mon,) studied this question.