Key points are not available for this paper at this time.
The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (109 A/cm2) show that no observable failure in the nanotube structure and no measurable change in the resistance are detected at temperatures up to 250 °C and for time scales up to 2 weeks. Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.
Wei et al. (2001) studied this question.