© 2026 IEEE. Personal use of this material is permitted. This is the author‑accepted manuscript (AAM) of a paper accepted for publication in IEEE Transactions on Instrumentation and Measurement. The final Version of Record is available at https://doi.org/10.1109/tim.2026.3684656 , Wei Zhao (wei.zhao@ieee.org)
Wei et al. (Thu,) studied this question.