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It is shown that the low-frequency spectral density of the voltage noise in a current-biased Josephson junction with critical current I₀, shunt resistance R, and small capacitance is e{I₀^2R^3} in the limit eVk₁T (I{{I₀}) }^2 and I>I₀, where V is the voltage and I is the current. The noise arises from zero-point current fluctuations in the shunt resistor. The rounding of the current-voltage characteristic caused by the quantum fluctuations and the effects of nonzero junction capacitance are calculated.
Koch et al. (Mon,) studied this question.