Spatially and Temporally Resolved Mapping of Contact Electrification on Stand-Alone Ultrathin Glass Materials via Kelvin Probe Force Microscopy

Key Points

• The aim is to develop a method for characterizing contact electrification in ultrathin glass materials using Kelvin probe force microscopy.
• Used Kelvin probe force microscopy to map contact electrification at nanoscale.
• Applied external bias to AFM tips to manipulate the CE response of glass materials.
• Extended characterization techniques from oxide thin films to stand-alone oxide materials.
• Demonstrated precise mapping of CE at 100 μm scale.
• Showed that external bias can enhance or invert CE responses.
• Provided a framework for understanding electrostatic charging in glass systems.