Novel co-design improves fault tolerance and efficiency in printed electronics, suggesting scalable solutions for flexible applications.
The demand for next-generation flexible electronics in applications like smart packaging and smart bandages has driven the need for cost-effective solutions. Traditional silicon-based electronics struggle with high costs and rigidity, making them unsuitable for these emerging markets. In this regard, additive printed electronics (PE) offer a viable alternative with their flexibility and ultra-low-cost manufacturing. Printed analog neuromorphic circuits (pNCs) are well-suited for these target applications, especially for classification tasks, as their low device count can efficiently meet the needs of the technology. However, low-cost additive manufacturing comes with higher defect rates, such as misprints, broken connections, and defective components, posing significant challenges to the reliability of printed circuits. This paper presents a novel co-design of training algorithm and hardware for fault-tolerant pNCs using fault-aware training (FAT). The proposed method introduces a fault-tolerant version of printed nonlinear transformation circuits, combined with a bespoke training process that selects different types of printed activation functions (AFs) for different neurons to optimize both fault endurance and hardware costs. Experiments on benchmark datasets demonstrate an improvement in the accuracy of fault-tolerant (FT) pNCs from 62.1% to 79.4% under a 10% fault rate. Moreover, combining both normal and fault-tolerant versions of activation functions (AFs) using gumble-softmax distribution shows acceptable accuracy drop with an average reduction in power and area of 54.5% and 6.54%, respectively, while reducing the training time significantly by 56.2%, compared to only using FT-AFs.
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Pal et al. (2025) studied this question.
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