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August 17, 2025ElectronicsOpen Access

Multi-Criteria Visual Quality Control Algorithm for Selected Technological Processes Designed for Budget IIoT Edge Devices

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The multi-criteria visual quality control algorithm enhances defect detection in IIoT settings, suggesting cost-effective implementation benefits.

The algorithm improves defect detection while maintaining low costs for IIoT applications, revolutionizing visual quality control.
Key metric SSIM, alongside depth image analysis and AI models, shows substantial improvements in quality assessment effectiveness.
The approach employs a hybrid algorithm leveraging traditional and advanced techniques for superior performance.
The design minimizes reliance on neural network training, enabling deployment on low-power edge devices without significant hardware.

Piotr Lech (2025) studied this question.

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August 17, 2025ElectronicsOpen Access

View Full Paper

Ask AI

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Authors

The multi-criteria visual quality control algorithm enhances defect detection in IIoT settings, suggesting cost-effective implementation benefits.

The algorithm improves defect detection while maintaining low costs for IIoT applications, revolutionizing visual quality control.
Key metric SSIM, alongside depth image analysis and AI models, shows substantial improvements in quality assessment effectiveness.
The approach employs a hybrid algorithm leveraging traditional and advanced techniques for superior performance.
The design minimizes reliance on neural network training, enabling deployment on low-power edge devices without significant hardware.

Piotr Lech (2025) studied this question.

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