Aberration-Robust Near- and Far-Filed Common-Path Optical Detection via Integrated Scanning Light Field Imaging and Digital Adaptive Optics

High-resolution spatial optical detection systems integrating near- and far-field imaging are crucial for photonic device characterization. However, existing approaches typically require complex optical alignments, and their performance degrades substantially in the presence of aberrations. Here, we present an aberration-robust spatial optics detection platform that integrates scanning light-field imaging (SLFI) and digital adaptive optics (DAO) based on the seamless unification of near- and far-field imaging in a common path architecture. A laterally scanned microlens array (MLA) at the native image plane (NIP) captures dense spatial-angular data, while DAO corrects wavefront errors in post-processing. Switching between the near- and far-field imaging modes is achieved simply by translating a rear lens element. Simulation results confirm stable performance under random aberrations up to 3 λ RMS, and experiment results show that clear, high-resolution images (~25.4 lp/mm) can be reconstructed using only two low-cost biconvex lenses. The system therefore offers a practical and cost-effective solution for comprehensive optical characterization.