Comparative modeling shows that wave aberrations affect diffraction patterns in focusing systems, highlighting machine learning recognition advantages.
We realize a comparative modeling of the wave aberrations influence in the focal plane with additional apodization of the focusing system by a phase binary axicon. In this case, the point spread function (PSF) becomes a bifurcated ring instead of a point. It is shown that the presence of an axicon leads to a larger visual area of distortion when aberrations appear which potentially increases the efficiency of their recognition by machine learning. It was found that a phase binary axicon with a numerical aperture of 0.002 allows for significantly better visualization of distortion regions when aberrations appear compared to a conventional PSF.
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Serafimovich et al. (2025) studied this question.
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